Lead-Free Piezoelectric Materials. Jing-Feng Li. Читать онлайн. Newlib. NEWLIB.NET

Автор: Jing-Feng Li
Издательство: John Wiley & Sons Limited
Серия:
Жанр произведения: Техническая литература
Год издания: 0
isbn: 9783527817054
Скачать книгу
normal pi Over 2 EndFraction left-parenthesis 1 plus StartFraction normal upper Delta upper F Over upper F Subscript normal r Baseline EndFraction right-parenthesis tangent StartFraction normal pi Over 2 EndFraction StartFraction normal upper Delta upper F Over upper F Subscript normal r Baseline EndFraction"/>

      1.4.3 Mechanical Quality Factor

      The mechanical Q (also referred to as Q) is the ratio of the reactance to the resistance in the series equivalent circuit representing the piezoelectric resonator, which is related to the sharpness of the resonance frequency. The mechanical QM can be calculated using the equation:

      (1.15)upper Q Subscript normal upper M Baseline equals StartFraction f Subscript normal r Baseline Over f 2 minus f 1 EndFraction

      where fr is the resonance frequency, f1 and f2 are frequencies at −3 dB of the maximum admittance. The mechanical QM is also related to the electromechanical coupling factor k, following the equation:

      (1.16)upper Q Subscript normal upper M Baseline equals StartFraction 1 Over 2 normal pi upper F Subscript normal r Baseline upper Z Subscript normal m Baseline upper C 0 EndFraction left-parenthesis StartFraction upper F Subscript normal a Superscript 2 Baseline Over upper F Subscript normal a Superscript 2 Baseline upper F Subscript normal r Superscript 2 Baseline EndFraction right-parenthesis

      where

F r Resonance frequency (Hz)
F a Anti‐resonance frequency (Hz)
Z m Impedance at Fr (ohm)
C 0 Static capacitance (Farad)

      1.5.1 Measurement of Direct Piezoelectric Coefficient Using the Berlincourt Method

      One of the most crucial figures of merits characterizing a piezoelectric material is the piezoelectric charge constant, also called the direct piezoelectric coefficient. It reflects the internal generation of electrical charges resulting from an applied mechanical force, as previously mentioned. Basically, the higher the piezoelectric charge constant, the more active a piezoelectric material is. A fast and accurate evaluation of the direct piezoelectric coefficient can be realized by the Berlincourt method associated with a quasi‐static piezo d33‐meter [6, 28–31]. In this method, sample size or geometric shape becomes a factor that need not be strictly taken into account. Besides, the availability and convenient operation of a d33‐meter are obvious, which make it a predominantly used method in practice. However, the name of “Berlincourt method” is often mistaken by some people nowadays as being synonymous with the quasi‐static measurements of the direct piezoelectric coefficient. The latter more broadly refers to the methods operating at low or quasi‐static frequencies, and its basic principle of was proposed in “Piezoelectric Ceramics” by Jaffe et al. The name of “Berlincourt” actually derives from the researcher, Don Berlincourt, who devoted a lot of effort to the development of the initial commercial d33 apparatus based on the quasi‐static measurement principle [28].

      Here, we consider a simple case of measuring the d33 value of a ceramic sample poled along the three‐direction (z) to elucidate the mathematical basis for the Berlincourt method. In the common case, the interaction between the mechanical and electrical behavior can be described by the equation d33 = [δD3/δT3]E, where D3 denotes electric displacement along the three‐direction (z) and T3 denotes applied stress also along the three‐direction (z). For the practical measurement of d33, this equation can be altered as d33 = [(Q/A)⋯(F/A)] = (Q/F), where F is applied force, A is the acting area, and Q is charge developed. It is obvious that d33 can be determined via measuring the charge induced by a certain force applied on the piezoelectric samples, while the measurement of the areas can be neglected as they cancel out. It should be noted that a constant electric field as fulfilled in the short‐circuit condition is the prerequisite of this measurement. To achieve this condition, a large capacitor across the Device Under Test (DUT) or a virtual‐ground amplifier is often embedded in the test system.

Schematic illustration of the components in the force loading system, divided to three parts, namely, contact probes, loading actuator, and reference sample.

      Source: Modified from Cain [31].