Design for Excellence in Electronics Manufacturing. Cheryl Tulkoff. Читать онлайн. Newlib. NEWLIB.NET

Автор: Cheryl Tulkoff
Издательство: John Wiley & Sons Limited
Серия:
Жанр произведения: Техническая литература
Год издания: 0
isbn: 9781119109396
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vibration

       Bending

       Integrated circuit/semiconductor wear‐out

       Thermal derating

       Failure rate analysis

       Conductive anodic filament (CAF) qualification

       High‐fidelity PCB modeling

      Sherlock provides actionable recommendations and presents results in comprehensive, professional reports suitable for internal and external distribution.

      Establishing a comprehensive reliability program requires extensive planning, training, and expertise. Once established, however, an effective program reduces risk, costs, and failures and results in products that function reliably and satisfy customers. The simple truth is that designing in reliability up front pays off immensely over the life of the product. A reliability program ensures that this happens.

      As can be seen, each type of test plan has unique properties and approaches.

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      2 Allen, G. and Jarman, R. (1999). Collaborative R and D. New York: Wiley and Sons.

      3 Ireson, W. and Coombs, C. (1989). Handbook of Reliability Engineering and Management. New York: McGraw Hill.

      4 Morgan, L. (2015). 7 common biases that skew big data results. Information Week.

      5 Nuzzo, R. (2015). How scientists fool themselves ‐ and how they can stop. Nature 526: 182‐185. doi: 10.1038/526182a.

      6 O'Connor, P. (2012). Practical Reliability Engineering. New York: Wiley and Sons.

      7 Porta, M. (2014). A dictionary of epidemiology. Oxford University Press.

      8 Tinsley, C.H., Dillon, R.L., and Madsen, P.M. (2011). How to avoid catastrophe. Harvard Business Review. https://hbr.org/2011/04/how-to-avoid-catastrophe.

      9 Tulkoff, C. (2017). How reliable is your reliability data? Global SMT and Packaging Magazine.

      10 Wunderle, B. and Michel, B. (2006). Progress in reliability research in the micro and nano region. Microelectronics and Reliability 46 (9): 11.

      11 Wunderle, B. and Michel, B. (2007). Printed circuit board design integrity: The key to successful PCB development. http://new.marketwire.com/2.0/rel.jsp?id=730231.

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