Applications and Metrology at Nanometer Scale 1. Abdelkhalak El Hami. Читать онлайн. Newlib. NEWLIB.NET

Автор: Abdelkhalak El Hami
Издательство: John Wiley & Sons Limited
Серия:
Жанр произведения: Техническая литература
Год издания: 0
isbn: 9781119808145
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       Reliability of Multiphysical Systems Set

      coordinated by

      Abdelkhalak El Hami

      Volume 9

      Applications and Metrology at Nanometer Scale 1

       Smart Materials, Electromagnetic Waves and Uncertainties

      Pierre-Richard Dahoo

      Philippe Pougnet

      Abdelkhalak El Hami

      Apart from any fair dealing for the purposes of research or private study, or criticism or review, as permitted under the Copyright, Designs and Patents Act 1988, this publication may only be reproduced, stored or transmitted, in any form or by any means, with the prior permission in writing of the publishers, or in the case of reprographic reproduction in accordance with the terms and licenses issued by the CLA. Enquiries concerning reproduction outside these terms should be sent to the publishers at the undermentioned address:

      ISTE Ltd

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       www.iste.co.uk

      John Wiley & Sons, Inc.

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       www.wiley.com

      © ISTE Ltd 2021

      The rights of Pierre-Richard Dahoo, Philippe Pougnet and Abdelkhalak El Hami to be identified as the authors of this work have been asserted by them in accordance with the Copyright, Designs and Patents Act 1988.

      Library of Congress Control Number: 2020946679

      British Library Cataloguing-in-Publication Data

      A CIP record for this book is available from the British Library

      ISBN 978-1-78630-640-1

      Preface

      The various actions taken worldwide in support of sustainable development and greenhouse gas emission control have led to increasingly restrictive regulations. Manufacturers in the automotive field have thus developed innovative mechatronic systems, enabling various vehicle functions to go electric. Confronted with the globalization of exchanges that has generated stronger competition and a surge of new product performances, companies in the sector of embedded mechatronic systems are developing new products at an increasingly faster rate.

      In other domains, to achieve volume or mass reduction or curb energy dissipation, manufacturers of mechatronic systems are developing new assembly methods based on multimaterials (e.g. composite materials, hybrids) or on innovative nanomaterials (e.g. carbon nanotubes). Modeling is essential to reduce product development cost, shrink time to market, understand failure mechanisms occurring in the operating conditions and optimize design before launching production. The reliability-based design optimization (RBDO) method is a modeling approach that optimizes design, guarantees the required high level of performance and takes into account the variability in the manufacturing process as well as the climatic variability in the use conditions. The efficiency of RBDO, however, depends on a solid understanding of the failure mechanisms caused by aging.