(3.6.2)
Figure 3.6.1 Venn diagram showing events
and .We can rewrite (3.5.1) in the form
(3.6.3)
The rule provided by (3.6.3) is known as Bayes's theorem for two events E and F; the probabilities
Example 3.6.1 (Bayes's theorem in action) The Gimmick TV model A uses a printed circuit, and the company has a routine method for diagnosing defects in the circuitry when a set fails. Over the years, the experience with this routine diagnostic method yields the following pertinent information: the probability that a set that fails due to printed circuit defects (PCD) is correctly diagnosed as failing because of PCD is 80%. The probability that a set that fails due to causes other than PCD has been diagnosed incorrectly as failing because of PCD is 30%. Experience with printed circuits further shows that about 25% of all model A failures are due to PCD. Find the probability that the model A set's failure is due to PCD, given that it has been diagnosed as being due to PCD.
Solution: To answer this question, we use Bayes's theorem (3.6.3) to find the posterior probability of a set's failure being due to PCD, after observing that the failure is diagnosed as being due to a faulty PCD. We let
F = event, set fails due to PCD
E = event, set failure is diagnosed as being due to PCD
and we wish to determine the posterior probability
We are given that
Notice that in light of the event E having occurred, the probability of F has changed from the prior probability of 25% to the posterior probability of 47.1%.
Formula (3.6.3) can be generalized to more complicated situations. Indeed Bayes stated his theorem for the more general situation, which appears below.
Figure 3.6.2 Venn diagram showing
mutually exclusive events in S. Theorem 3.6.1 (Bayes's theorem) Suppose that
(3.6.4)
We note that (3.6.3) is a special case of (3.6.4), with