6 Chapter 6Figure 6.1 (a) Scheme of the AFM‐SCM circuital approach. (b) Sketch of the e...Figure 6.2 (a) Microscope image of NDs deposited on a glass layer. TEM image...Figure 6.3 Post‐processed TEM images: (a) 3D image processing of silica NPs;...Figure 6.4 MWPECVD reactor and plasma generated during diamond film growth....Figure 6.5 Enhanced light of an optical fiber end embedded in a PDMS‐Au tip ...Figure 6.6 PDMS‐Au scattering efficiency versus the working wavelength for d...Figure 6.7 (a) Unit cell: modeling of PDMS with monodisperse GNs. (b) Zoomed...Figure 6.8 FEM simulations: (a) light propagating in the PDMS material; (b) ...Figure 6.9 (a) Metallic wedge in dielectric materials. (b) Transmission line...Figure 6.10 (a) Cylindrical coordinate system. (b) Spherical coordinate syst...Figure 6.11 Metallic permittivity theoretical trend: (a) gold; (b) silver; (...Figure 6.12 STRD theoretical near field radiation pattern for a gold metalli...Figure 6.13 90° metallic wedge: total TEz electric field theoretical trend v...Figure 6.14 Optical antenna as micrometric aperture in a parallel‐plate wave...Figure 6.15 Basic scheme of pressure sensor (longitudinal section): (a) tape...Figure 6.16 (a) PDMS‐Au robotic finger (tactile pressure sensor). (b) Light ...Figure 6.17 (a) PDMS‐Au tip of the optical pressure sensor for robotic finge...Figure 6.18 Small notch sensing approach and signal detection principle and Figure 6.19 PDMS‐Au used for surveillance security systems. (a) Schematic co...Figure 6.20 PDMS‐Au 2×2 matrix pillar‐type sensor layout for liquid detectio...Figure 6.21 PDMS‐Au 2×2 matrix pillar‐type layout. The height of a single pi...Figure 6.22 (a) AFM image: topography indicating gold fillers in a PDMS matr...Figure 6.23 Absorbance trend of a PDMS/PDMS‐Au bulk type sample. Inset: radi...Figure 6.24 Total electric field confinement: sketch of a simulation for a P...Figure 6.25 2 × 2 PDMS‐Au matrix: variation of the transmitted intensity by ...Figure 6.26 Basic principle of light scattering.Figure 6.27 Sensor optical spectra: transmitted optical intensities for diff...Figure 6.28 Implementation of the sensor in a robotic finger.Figure 6.29 Microwave MEMS pressure sensor: (a) masks used for photolithogra...Figure 6.30 (a) Ring MEMS and (b) zooming of the base of the antenna.Figure 6.31 Electromagnetic absorbing material for antenna measurements.Figure 6.32 Three‐dimensional model of silica NPs embedded in a lymph node....Figure 6.33 (a) Multilayer model of an ultrasound wave propagated in human t...Figure 6.34 Unit cell model of in the mediastinum lymph node.Figure 6.35 (a) Theoretical normalized power spectrum of the diffracted wave...Figure 6.36 TEM image of synthetized silica NPs (inset: zooming of some sili...Figure 6.37 Example of functionalized silica NP synthesis by MPTS.Figure 6.38 Example of functionalized silica NP synthesis by TEOS.Figure 6.39 Current density J calculation characterizing insulation behavior...Figure 6.40 Measured current of diamond film growth on a silicon substrate....Figure 6.41 (a) A piece of commercial substrate. (b) Example of a ND layer d...Figure 6.42 I–V characteristic of a ND sprayed layer deposited on a silicon ...
7 Chapter 7Figure 7.1 (a) Setup for defect monitoring of tire assembly. (b) K‐means alg...Figure 7.2 Architecture of the stack of the neural network used for defect d...Figure 7.3 Flowchart of a full approach for tire quality check and defect mo...Figure 7.4 (a) Watershed and geometrical analogy of local minima and local m...Figure 7.5 Flowchart modeling for welding defect check.Figure 7.6 Sequence diagram of the image vision system based on image segmen...Figure 7.7 Encoding and decoding enabling AI algorithm processing.Figure 7.8 (a) Digital circuit configuration of an encoder. (b) Black box mo...Figure 7.9 Algorithm running into an AI processor (AI engine).Figure 7.10 (a) Digital circuit configuration of a decoder. (b) Black box mo...Figure 7.11 Pixel matrix of an image subset.Figure 7.12 AND logic ports implementing the feature in Figure 7.11.Figure 7.13 3D image processing enhancing welding defect. (a) Infrared therm...Figure 7.14 Architecture model of the adopted techniques used for quality pr...Figure 7.15 (a) Image vision architecture of a system checking hole precisio...Figure 7.16 (a) Block diagram modeling the profilometer image vision system....Figure 7.17 Architecture of detection system integrating AI and 3D technolog...Figure 7.18 AR architecture improving production processes.Figure 7.19 Infrastructure integrating infrared camera circuits.Figure 7.20 Thermal image of conveyor belt rollers showing areas of anomalou...Figure 7.21 (a) Thermal image of conveyor belt rollers in gray scalebar. (b)...Figure 7.22 Ideal dynamic extraction of the active contour snake method.Figure 7.23 Snake contour plot applied to a radiometric image: dynamic conve...Figure 7.24 Snake contour plot applied to the image of a processed metallic ...Figure 7.25 (a) K‐means image processing calculated for a cluster number of ...Figure 7.26 Theoretical areas of extracted contours versus the defect number...Figure 7.27 (a) 3D image reconstruction of vegetables with defects. (b) 3D i...Figure 7.28 (a) Thermogram of a meat product (inset: original image of the p...Figure 7.29 Theoretical trend of minimum temperature indicating risk regions...Figure 7.30 Image processing procedure based on pixel features training and ...Figure 7.31 (a) Original image of a micrometric aperture with the definition...Figure 7.32 (a) TEM image of silica nanoparticles. (b) Class definition iden...Figure 7.33 (a) Thermogram of a conveyor belt carpet. (b) Feature extraction...
8 Chapter 8Figure 8.1 Example of a full RE platform.Figure 8.2 DFX model defining RE advanced production.Figure 8.3 Example of a flexible production line oriented toward Industry 5....Figure 8.4 (a) Process mining and a fully integrated DT data flow selecting ...Figure 8.5 Measured, theoretical and predicted values of hole diameters.Figure 8.6 Feedback system updating tolerances and machine parameters during...Figure 8.7 Architecture of a smart visor used for piece measurement with the...Figure 8.8 RE applied to PC structures: (a) 3D reconstruction of a SEM image...Figure 8.9 Classification and automatization of the best choice of a pipelin...Figure 8.10 SEM images of damaged ring MEMS: (a–c) effects of a high voltage...Figure 8.11 Technological phase for freestanding ring MEMS: (a–h) phases of ...Figure 8.12 (a) Torsion allowing helicoidal layout. (b) SEM image of an heli...Figure 8.13 Via hole connection of the top metallic layer.Figure 8.14 (a) Cross section of the coaxial feeding layout exciting by THz ...Figure 8.15 (a) Front view and (b) side view of a three‐point connection lay...Figure 8.16 Photograph of the diamond planar antenna sensor. Inset: optical ...Figure 8.17 Deformation displacement along the x‐ and y‐ directi...Figure 8.18 Measured S11 responses of different antenna prototypes. Inset: p...Figure 8.19 Advanced RE processes in Industry 5.0: production of a new senso...Figure 8.20 First prototype of PDMS‐Au pressure sensor. (a) side view; (b) s...Figure 8.21 Second prototype of PDMS‐Au pressure sensor. (a) side view; (b) ...Figure 8.22 RE: jumper solution.Figure 8.23 Thickness trend versus electrical