Mechanical Stress on the Nanoscale. Simulation, Material Systems and Characterization Techniques - Отсутствует
| Автор: | Отсутствует |
| Издательство: | John Wiley & Sons Limited |
| Серия: | |
| Жанр произведения: | Зарубежная образовательная литература |
| Год издания: | 0 |
| isbn: | 9783527639564 |
Bringing together experts from the various disciplines involved, this first comprehensive overview of the current level of stress engineering on the nanoscale is unique in combining the theoretical fundamentals with simulation methods, model systems and characterization techniques. Essential reading for researchers in microelectronics, optoelectronics, sensing, and photonics.